Quantum Devices Scanning Electron Microscope High Precision Microscope At4000proat3200

• Customization: Available
• Specification: customizable
• Trademark: Anttrans
• Model NO.: AT-61012
• Origin: China
• Package Size: 200.00cm * 300.00cm * 400.00cm
• Package Gross Weight: 10000.000kg

Product Description

Product Description

 

Tungsten Filament Scanning Electron Microscope - AT3200
AT3200 is a versatile upright tungsten filament scanning electron microscope with excellent overall capabilities. Its unique dual-anode structure of the electron gun ensures high resolution and better image signal-to-noise ratio at low voltages. Additionally, numerous optional accessories are available, making AT3200 a comprehensive analytical instrument with a wide range of applications.

Product Features
Low Voltage
For carbon material samples, at low voltages, the penetration depth is small, enabling the acquisition of the true surface morphology of the sample with richer details.
For hair samples, at low voltages, the electron beam irradiation damage is reduced, and the charging effect is eliminated simultaneously.
Low Vacuum
For filter fiber tube materials with poor conductivity, significant charging occurs under high vacuum. However, under low vacuum, direct observation of non-conductive samples is possible without coating.
Large Field of View
For biological samples, using the large field of view allows for easily obtaining the overall morphology and head structure details of ladybugs, demonstrating cross-scale analysis.
Special Functions
Intelligent Auxiliary Stigmation: Intuitively reflects the stigmation degree of the entire field of view. By clicking on a clear area with the mouse, the stigmation can be quickly adjusted to the best.
Automatic Focusing: One-click focusing for rapid imaging.
Automatic Stigmation Correction: One-click stigmation correction to improve work efficiency.
Automatic Brightness and Contrast: One-click adjustment of brightness and contrast to obtain an image with appropriate grayscale.
Simultaneous Imaging of Multiple Information: The AT3200 software supports one-click switching between mixed imaging of SE and BSE. It allows simultaneous observation of the morphology and composition information of the sample.
Rapid Image Rotation: By dragging a line, the image immediately "adjusts to the correct angle."
Application Cases
Microstructural Analysis of Nanomaterials: In MOFs (Metal-Organic Frameworks) material research, AT32 00 can clearly observe the surface morphology of materials, such as regular cubic structures, fine particles adsorbed on the surface, and details of folds and pores. Its high resolution of 3 nm and uniform imaging brightness provide reliable support for nanomaterial characterization.
3D NAND Storage Device Inspection: AT3200 is used for verticality measurement of 3D NAND storage channels:
Microimaging: Clearly presents the cylindrical structure and wall characteristics (such as roughness, deformation) of the channels, providing a baseline for measurement.
Verticality Measurement: In conjunction with image analysis software, it calculates the angle between the channel axis and the reference plane, accurately assessing verticality deviations, and aiding in the optimization of ATiconductor manufacturing processes.
Observation of Biological and Non-conductive Samples:
Biological Samples: The large field of view function allows simultaneous display of the overall morphology and head details of ladybugs, enabling cross-scale analysis.
Low Vacuum Mode: Allows direct observation of samples with poor conductivity (such as filter fiber tubes) without coating, avoiding interference from the charging effect.

Product Parameters

 

Product Specifications

Parameter		AT3200
Key Parameters	Resolution	3 nm @ 30 kV, SE  7 nm @ 3  kV, SE  4 nm @ 30 kV, BSE  3 nm @ 30 kV, SE, 30 Pa
	Accelerating Voltage	0.2  kV ~ 30 kV
	Magnification	1 x ~ 300,000 x
Specimen Chamber	Low Vacuum Mode	5~1000 Pa (optional)
	Camera	Optical navigation + monitoring inside the specimen chamber
	Specimen Stage Type	Five-axis vacuum motor-driven
	XY Travel	125 mm
	Z Travel	50 mm
	T Travel	-10° ~ +90°
	R Travel	360°
Detectors	In-Chamber Secondary Electron Detector (ET D)	.
	Backscattered Electron Detector (BSED)	(Five-segment, optional)
	Energy Dispersive Spectrometer (EDS)	○
	Electron Backscatter Diffraction (EBSD)	○
Expansions	Specimen Exchange Chamber	○
	Knob Plate & Trackball	○
Software	Operating Software	Windows operating system, Chinese AT software
	Navigation	Optical navigation, gesture quick navigation, trackball  (optional)
	Automatic Functions	Automatic brightness and contrast, automatic focusing, automatic stigmation
.Standard ○Optional / no

Detailed Photos