Quantum Devices Scanning Electron Microscope High Precision Microscope At4000PRO

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  • Quantum Devices Scanning Electron Microscope High Precision Microscope At4000PRO
  • Quantum Devices Scanning Electron Microscope High Precision Microscope At4000PRO
  • Quantum Devices Scanning Electron Microscope High Precision Microscope At4000PRO
  • Quantum Devices Scanning Electron Microscope High Precision Microscope At4000PRO
  • Quantum Devices Scanning Electron Microscope High Precision Microscope At4000PRO
  • Quantum Devices Scanning Electron Microscope High Precision Microscope At4000PRO
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  • Overview
  • Product Description
  • Product Parameters
  • Detailed Photos
Overview

Basic Info.

Model NO.
AT-61012

Packaging & Delivery

Package Size
100.00cm * 200.00cm * 200.00cm
Package Gross Weight
500.000kg

Product Description

Product Description

Field Emission Scanning Electron Microscope AT4000Pro


The AT4000Pro is an analytical thermal field emission scanning electron microscope equipped with a high-brightness, long-life Schottky field emission electron gun. It features a three-stage magnetic lens design, providing significant advantages in applications such as EDS, EBSD, and WDS. It comes standard with a low-vacuum mode, along with high-performance low-vacuum secondary electron detectors and plug-in backscattered electron detectors, allowing observation of samples with weak or no conductivity.
Product Advantages
Equipped with a high-brightness, long-life Schottky thermal field emission electron gun.
High resolution, with a limiting resolution better than 0.9 nm at 30 kV.
Three-stage magnetic lens design with a wide adjustable beam current range, supporting an analytical beam current of up to 200 nA.
Leak-free objective lens design, enabling direct observation of magnetic samples.
Standard low-vacuum mode and high-performance detectors.
Standard optical navigation mode and Chinese operating software, making analysis work easier.
 

Product Parameters

 

Product Parameters

Key Parameters Resolution 0.9 nm @ 30 kV, SE
2.5 nm @ 30 kV, BSE, 30 Pa
1.5 nm @ 30 kV, SE, 30 Pa
Accelerating Voltage 200 V ~ 30 kV (35 kV optional )
Magnification 1 ~ 1,000,000 x
Electron Gun Type Schottky Field Emission Electron Gun
Specimen Chamber Low-Vacuum Mode Max 180 Pa
Cameras Dual cameras (Optical Navigation + In-Chamber Monitoring)
Travel Range X=1 10 mm, Y=110 mm, Z=65 mm
Tilt & Rotation T: -10°~+70°, R: 360°
Detectors & Extensions Standard In-Chamber Electron Detector (ETD)
Low-Vacuum Secondary Electron Detector (LVD)
Plug-in  Backscattered Electron Detector (BSED, five-segment, optional)
Optional Energy Dispersive Spectrometer (EDS)
Electron Backscatter Diffraction (EBSD)
Plug-in Scanning Transmission Electron Microscope (STEM) Detector
Specimen Exchange Chamber (4"/8")
Trackball & Knob Panel
Software Language Chinese AT Software
Operating System Windows
Navigation Optical Navigation, Gesture Shortcut Navigation, Trackball (optional)
Automatic Functions Automatic Brightness/Contrast, Autofocus, Automatic Ast igmatism Correction
 
Detailed Photos

 

Quantum Devices Scanning Electron Microscope High Precision Microscope At4000PROQuantum Devices Scanning Electron Microscope High Precision Microscope At4000PROQuantum Devices Scanning Electron Microscope High Precision Microscope At4000PROQuantum Devices Scanning Electron Microscope High Precision Microscope At4000PROQuantum Devices Scanning Electron Microscope High Precision Microscope At4000PROQuantum Devices Scanning Electron Microscope High Precision Microscope At4000PROQuantum Devices Scanning Electron Microscope High Precision Microscope At4000PRO

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